AnalogTest.docx
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- 上传时间:2023-02-05
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AnalogTest.docx
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AnalogTest
Relaydeclarationportion
TestType
AnalogTest:
Additionoptiontomakethemeasurementmoreaccurate
ReferenceValue,
Rangefrom1to6
ExpectedValue
Summary:
Alltheanalogtestconsistof2sections:
a.relaycontrolstatement
⏹declarationonrelaycloseragainstrespectivebusestodeviceundertest
b.testcommand
⏹performsthemeasurementwiththespecifiedoptions
Allanalogsfileislocatedin“analog”directory.
Themachineusestheobjectfiletoexecutethetest.
Ifthesourcefileiseditandwithoutcompile,theoldobjectfilewillbeuse.
AnalogTest:
Hardwareneeded:
a.Voltagesource
b.Previsionreferenceresistor
c.MOA
d.Internalvoltmeter
e.Relayforconnection
s-bus
i-bus
IRx
IRef
Gain=Vmoa/Vs
IRx=IRef;wheresummingNode=0voltwithhighinputimpedanceofop-amp
Vs/Rx=Vmoa/Rref=0volt
Vs/Rx=-Vmoa/Rref
Rx=-(Vs/Vmoa)Rref
Gain=-Rref/Rx
Tomakeagoodmeasurement,Galwaysneedtobebetween–1to–10.Closerto–1,thebestandstabletestwillbe.
WhatNeedToDoIfRmeasure Question: WhatcancausevoltagedroponRxis ? Answer: Rxisfix,wheretheonlyvariableiscurrentflowthruRx,IRx Example: IfthereisanotherpathwhichisconnecttoRx,IRx Solution: GroundingtheZsgandZig,willpreventcurrentflowonthatpath. Therefore,thecurrentflowthruRxwillresumeas: IRxΞIRef;whereIp=0amp WhatYouNeedToDoIfRmeasure>Rxactual Question: WhatcancausevoltagedroponRxbiggerthenexpected? ? Answer: Additionimpedancefroms-busortheinternalvoltagesourcefromASRUcard,wheretheRx=Rx+Z Example: IRef=Vmoa/Rref, However………… IRx<>Vs/Rx,but IRx=Vs/(Rx+Rs+Ri) Solution: SolutiononadditionimpedanceformS-bus,Zs: ∙PlaceaDVMtosensethevoltagedroponZsbyadding“a-bus” ∙TheinputimpedanceofDVMisprettyhighandnocurrentwillthanflowthru.ThiswillnotreducethecurrentflowthurRx. SolutiononadditionimpedancefromI-bus,Zi: Addb-bustomovethevirtualgroundclosetoDUT Add“en”option,toenhance a.VoltagemeasurementacrossRRef b.ActualmeasurementonVsinsteadofassumeduringmeasurementcalculation WhathappenifthereisG-BusImpedance: WithG-Businternalimpedance,itmaycauseIRx<>IRef. Rxmeasure>Rxactual Solution: AdditionlbustothecircuitrywillhelptoreduceG-busimpedance. Note: TheMOAimpedanceisinfinite,andnocurrentwillthenflowthruL-bus path. Thereis2waysofwritingthel-busconnection: a.connectgto“node#”;lto“node#” b.connectglto“node#” CompleteExamplewithallOption: AnalogOption: a.reX ∙referenceresistorforMOA ∙range: re1tore6: re1=10ohm;101 re2=100ohm;102 ∙usetodefineamostaccurateGforanalogmeasurement c.arX ∙specifyrangesettingforASRU’sinternalmultimeter,MOA ∙arXusetosetcorrectexpectedoutputvoltage ∙userseldonchangeonthissetting ∙default: 100mVforanalogmeasurement d.amX ∙Vs,sourcevoltagerangesetting ∙Rangeof–10Vto+10V ∙Defaultvalue,Vs=100mV ∙Withrefertospec,measurepassivecomponentbyusingsourceof100mV e.wb ∙bandwidthofMOA ∙useduringhihgMOAgainisneededathighfrequencytest ∙wbnormallynotuseduringre1&re2setting,oritwillintenttosendMOAtosaturationstatus f.waitX ∙delaystatement ∙itwillwaittoexecuteeachtimevoltagesourceischanges ∙rangefrom0to9.99999sec ∙normalcaseusingmsec g.icoX ∙currentcomplianceofsource ∙ico0: 35mA ∙ico1: 150mA ∙bydefault35mA h.frX ∙frequencyofsource,Vs ∙Usingduringcapacitor&inductormeasurement,accomponentmeasurement ∙3ranges: 128,1024&8192 ∙iffrXisused,thesourcewillautomaticallychangefromDCtoAC i.comp/nocomp ∙forcapacitorlearningpurpose ∙comp: willrequestalearnstatementtothecapacitor,normallyuseon<200pF ∙nocomp: indicatethecapacitorwillnotperformlearningsection. ∙Learncapacitorwillalwaysdoduringthe1strunofthetest j.Ed ∙Forlinenoiserejection ∙Usetogetherwithfr128 ∙Thisstatementwillincreasetesttimeofabout17.5msecto20msec k.En Enhanceoption Thisresultamultiplemeasurementondevice With“en”,Vs,Vmoa,VrefandVitoMOAwillmeasure Itwillincuradditiontesttime l.sa sensebustoreduceimpedanceofs-bustoRxmeasurement m.sb sensebustomovethevirtualgroundreferencetoavoidimpactfromimpedanceofI-bustoRx n.sl sensebustoreduceimpactfromg-busimpedancetoRxmeasurement CapacitorTestingHint: Someteststructureusingasresistor,capacitorisusingMOAconceptwithACsourceinsteadofDC. Note: Therewillbeneededforcapacitortohaveacompensationstatementduetosomecapacitorinducebetweentesterandfixturewillcausesomemis-readingonthemeasurement. Thecompensationstatementwillbeuseonthecapacitorwhich<100pF(Sometimetobesafe,470pFwillexecuteundercompoption) RecommendedCapacitorMeasurementOption: Diode&ZenerDiodeTestConfiguration: Diode&Zenerwillusethesameconfiguration,whereforwardbiasvoltagemeasurementfordiodeandreversebiasvoltageforzener. Diode: 0.7volt(700mvolt): forwardbiasvoltage Zener: 18volt: reversebiasvoltage LED: 2.5volt: forwardbiasvoltage HinttoTestDiode&Zener: a.Diode: Setvoltagecompliance(co)valueatealst1voltgreaterthanhihgtestlimit Useguardingtoeliminatetheeffectogimpedanceinparallelwithdiodeundertest EnsureMOAoutputdoesnotexceed15Vdcor14Vpk b.Zener: Setvoltagecompliance,coto10volt,and8.99voltsforauxiliarysource. aroptionforzenerwillbewithinrangeof0to18volt Donotuseguardingonzenertest EnsureMOAoutputdoesnotexceed15Vdcor14Vpk FETTestConfiguration: TheFETtest,nfetrandpfetr,measureontheresistor(Ron)ofN-channelandP-channelFETsresepctively. Thes-bus(sourcebus)andI-bus(detectorbus)areconnectedtothesourceanddrainoftheFET. Theguard,G-busisconnectedtothegateoftheFET. N-channelFETsaretestedwithapositivesource P-ChannelFETsaretestedwithanegativesource HintForFETstest: BelowshowntherecommendedReferenceElement(re)RangeofRontest froption,ACsourcecanbeusetoreducetheeffectofparallelimpedance
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