扫描透射电子显微镜模式分析Word格式文档下载.docx
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扫描透射电子显微镜模式分析Word格式文档下载.docx
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BFdetector
Itisplacedatthesamesiteastheaperturein
BF-TEM
anddetectstheintensityinthedirectbeamfromapointonthespecimen.
2.
ADFdetector
Theannulardarkfield(ADF)detectorisadiskwithaholeinitscenterwheretheBFdetectorisinstalled.TheADFdetectorusesscatteredelectronsforimageformation,similartothe
DF
modeinTEM.
ThemeasuredcontrastmainlyresultsfromelectronsdiffractedincrystallineareasbutissuperimposedbyincoherentRutherfordscattering.
3.
HAADFdetector
Thehigh-angleannulardarkfielddetectorisalsoadiskwithahole,butthediskdiameterandtheholearemuchlargerthanintheADFdetector.Thus,itdetectselectronsthatarescatteredtohigheranglesandalmostonlyincoherentRutherfordscatteringcontributestotheimage.Thereby,
Zcontrast
isachieved.
Inaddition,thereistheoptiontoinstallaSecondaryElectronDetector
abovethesamplelikeinaSEMandtherebytoobtainadditionalmorphologicalinformation.
4.ThecentralDFandBFmodeinnormalTEM
InnormalTEM,wealsomentionedtheDFandBRmode.Actually,theyaredifferentwithADFandBFmentionedherecompletely.InnormalTEM,thedirecttransmittedbeamisblockedbytheapertureandthediffractedbeamisallowedpassing.WhenthediffractedbeamhitsthescreenandformsaimagewhichiscalledasDF.Otherwise,diffractedbeamisblockedwithapertureandtransmittedbeamformsBRimage.
However,inSTEMmode,theyaretotallydifferentbecausethebeamonsampleiscone-shapedbeamratherthanparallellight.
STEM模式和TEM模式的对比图
Z-contrastactuallyusesanannulardetectorwhichcanonlycollectthescatteredelectronsoutsidethebeamcone.Thatistosay,thetransmittedelectronsinsidebeamconeareinvolved.Thisisgoodthingforotherimagingmodebecausediffractioncontrastwasavoidedandtheimagingonlyhasdependenceonatomicstructure.ThisimagingmodeiscalledasSTEM-HAADF.Here,twoissuesarenotaddressedyet.OneiswhetherSTEM-BFandSTEM-ADFimaginginvolvesdiffractioncontrast.Personally,IthinkSTEM-ADFshouldinvolvephasecontrastandZcontrast.ForSTEM-BR,phasecontrastisgreatlyinvolved.However,incaseofHAADF,onlyZ-contrastworks.
CameraLengthaffectstheInnerCollectionangel.InourTEM,whencameralengthis11cm,theinnercollectionangelis60mrad.Oncethecameralengthreducingto5cm,theinnercollectionangelis110mrad.Therefore,thecollectionangleiscontrolledbythecameralength.Whoaffectsthecameralength?
Accordingtoequation(L=f*Mp*Ml)wherefisthefocaldistanceofobjectivelens(fisrelatedwiththeexcitedcurrent,accelerationvoltage,thenumberofcoil),MpandMlarethemagnificationofprojectivelensandintermediatelensrespectively.Experimentally,thefcanbechangedsignificantlythroughadjustingtheexcitedcurrent.Besides,inordertochangethecameralength,you
alsocanchangetheexcitedcurrentofprojectivelensorintermediatelens.Wheninnercollectionangleisbiggerthan100mrad,theRutherfordscatteringdominatestheimaging.
TheinneranglesforHAADFdetectorsareatleastthreetimestheangleofelectron-probe-formingaperture.InmanycasesofHAADFimaging,theannulardetectionanglewaspracticallysettobe60-170mradduetothelimitationofcombinationsbetweenaperturesizesandcameralengths.AboveimageshowsthepositionsofthedetectorswhichcanbeinstalledinaSTEMsystem.Dependingonthescatteringangleofthetransmittedelectrons,varioussignalscanbedetectedasafunctionofthepositionofthescanningprobe:
BF(bright-field)-STEM,DF(dark-field)-STEMorHAADF(highangleannulardarkfield)-STEM.
TheDFdetectorsareannularlyshapedtomaximizethecollectionefficiencyandtherangeofthecollectedscatteringanglescanbeadjustedthroughthemagnificationoftheintermediatelenses.
FEIHAADFdetector
Chapter1.IntroductiontoSTEM
SomeTEMshavescanningcoilswhichallowthemtobeusedasascanningtransmissionelectronmicroscope(STEM).InSTEM,aconicalelectronbeamisfocusedthroughthespecimenbyalensinfrontofthespecimen(C2andtheobjectivelenspre-fieldwhichisalsocalledminilens),asshownbelow.
TheopticalconfigurationisroughlythesameassimplyforminganimageofthefilamentbyfocussingC2thevery
firstexperimentwedidintheelectronmicroscope.Infact,ifyourmicroscopehasatwinobjectivelensincludingpre-fieldandbackfield,theopticsarealittlebitmorecomplicated,butletsstartthinkingaboutthingsassimplyaspossible.
Thesmallbeamcross-overatthespecimenplaneisusuallycalledanElectron
Probe.Imagescanbeformedbymovingtheprobeacrossthespecimen(bythedouble-deflectionshiftcoils)anddetectingthetransmittedelectrons,whichareeit
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